NanoES Institute

April 12, 2018

AFM Workshop for Scanning Microwave Impedance, May 1, 10:00 – 11:30 am, MolES 215

PrimeNano will give a talk on the method May 1st from 10:00 am – 11:30 am in MolES 215.  They will then provide demos on the technique using our AFM Dimension Icon that afternoon and the next day.

Speaker Bio: Oskar Amster, M.S. (Sr. Dir. Marketing of PrimeNano, Inc)

Mr. Amster has a background in Physics and Materials engineering with a focus on microelectronics processing. He has 20 years experience working with analytical instruments and metrology tools. His background is in applications development, strategic marketing, and product development. He has extensive experience working in Atomic Force Microscopy, Stylus Profilers, and Optical Profiler instruments. Prior to joining PrimeNano, Inc, Oskar was at KLA-Tencor and also held positions at several start-ups as well as mature instrument companies. He holds an MS in Materials Engineering and BS in Physics from Cal Poly San Luis Obispo.

ScanWave sMIM Presentation Abstract